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Electron Microscopes

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S/TEM Jeol JEM2800


  • Electron gun: Schottky Field Emission
  • Accelerating voltage: 100 kV, 200kV
  • Imaging modes:
    • Transmission electron microscopy
    • Scanning transmission microscopy
      • bright-field detector
      • dark-field detector
      • secondary electrons detector
  • Energy-dispersive X-ray spectroscopy detector Jeol Centurio: large solid angle silicon drift detector   with 100mm2 active area for ultrafast elemental mapping of S/TEM samples
  • 3D tomography (TEMography software – recorder, composer, visualizer)
  • TEM camera OSIS Veleta
  • CMOS TEM camera TemCam-XF416 (EM-Menu SW, EM-Tools SW)
  • SerialEM SW
  • Single-tilt holder
  • Double-tilt EDS dedicated holder
  • Multigrid-single-tilt holder (3 grids)
  • Double-tilt in situ MEMS-based heating holder Protochip Fusion Select
  • 3D tomography (TEMography software – Recorder, Composer, Visualizer)


TEM Tecnai 10

  • Electron gun: LaB6
  • Accelerating voltage: 80kV, 100kV
  • Imaging mode: Transmission electron microscopy
  • TEM camera OSIS Megaview G3


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TEM Tecnai 12


  • Electron gun: LaB6
  • Accelerating voltage: 100 kV, 120 kV
  • Imaging mode: Transmission electron microscopy
  • TEM camera OSIS Veleta
  • Cryo Transfer System for observation of frozen samples
  • SerialEM SW


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FE-SEM Merlin VP Compact + ATLAS Array Tomography


Accelerating voltage: 0.02 to 30kV


  • 0.8 nm @ 15 kV
  • 1.6 nm @ 1 kV
  • 0.8 nm @ 30 kV (STEM mode)

Probe current: up to 20nA

Vacuum modes:

  • High Vacuum
  • Variable pressure up to 60 Pa


  • High efficiency secondary electron detector HE-SE2 – Everhart-Thornley type
  • In-lens Duo detector – combination of In-lens SE and In-lens BSE imaging
  • Scanning transmission electron microscopy detector
  • Variable pressure secondary electron detector
  • Cathodoluminescence detector for material characterization
  • EDS detector: Octane Elite EDS System with 70 mm2 chip and silicon nitride (Si3N4) window

5-axes mot. eucentric stage with dual joystick controller

Plasma Cleaner for gentle removal of sample contamination

Local Charge Compensation for undisturbed imaging of non-conductive samples and in situ cleaning of sample surface

ATLAS Array Tomography for 3D reconstruction of sample data



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